X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 293 | 0.1 M MES-Na pH 6.5 10% PEG4000 0.1 M MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 293K |
Crystal Properties | |
---|---|
Matthews coefficient | Solvent content |
2.81 | 56.19 |
Crystal Data
Unit Cell | |
---|---|
Length ( Å ) | Angle ( ˚ ) |
a = 71.493 | α = 90 |
b = 71.493 | β = 90 |
c = 138.718 | γ = 120 |
Symmetry | |
---|---|
Space Group | P 31 2 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | ADSC QUANTUM 315 | 2007-12-02 | M | MAD | ||||||
2 | 1 | x-ray | 100 | CCD | ADSC QUANTUM 315 | 2007-12-02 | M | MAD | ||||||
3 | 1 | x-ray | 100 | CCD | ADSC QUANTUM 315 | 2007-12-02 | M | MAD | ||||||
1,2,3 | 1 |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 24-ID-C | 1.105275 | APS | 24-ID-C |
2 | SYNCHROTRON | APS BEAMLINE 24-ID-C | 1.085914 | APS | 24-ID-C |
3 | SYNCHROTRON | APS BEAMLINE 24-ID-C | 1.105462 | APS | 24-ID-C |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1,2,3 | 3 | 20 | 99 | 0.099 | 35.5 | 5.5 | 8615 | 8529 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1,2,3 | 3 | 3.11 | 93.2 | 0.459 | 3.1 | 5 | 848 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||
X-RAY DIFFRACTION | MAD | THROUGHOUT | 3 | 20 | 8189 | 8073 | 400 | 98.58 | 0.21054 | 0.21054 | 0.2084 | 0.21 | 0.25212 | 0.24 | RANDOM | 111.245 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
-3.05 | -1.53 | -3.05 | 4.58 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_scangle_it | 1.389 |
r_angle_refined_deg | 0.989 |
r_scbond_it | 0.872 |
r_nbtor_refined | 0.281 |
r_nbd_refined | 0.183 |
r_xyhbond_nbd_refined | 0.162 |
r_symmetry_vdw_refined | 0.117 |
r_chiral_restr | 0.048 |
r_bond_refined_d | 0.006 |
r_gen_planes_refined | 0.005 |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | |
Nucleic Acid Atoms | 2343 |
Solvent Atoms | 1 |
Heterogen Atoms | 116 |
Software
Software | |
---|---|
Software Name | Purpose |
CBASS | data collection |
SHARP | phasing |
REFMAC | refinement |
HKL-2000 | data reduction |
HKL-2000 | data scaling |